Element specific monolayer depth profiling
2014
Article
mms
| Author(s): | Macke, S. and Radi, A. and Hamann-Borrero, J. E. and Verna, A. and Bluschke, M. and Brück, S. and Goering, E. and Sutarto, R. and He, F. and Cristiani, G. and Wu, M. and Benckiser, E. and Habermeier, H.-U. and Logvenov, G. and Gauquelin, N. and Botton, G. A. and Kajdos, A. P. and Stemmer, S. and Sawatzky, G. A. and Haverkort, M. W. and Keimer, B. and Hinkov, V. |
| Journal: | {Advanced Materials} |
| Volume: | 26 |
| Number (issue): | 38 |
| Pages: | 6554--6559 |
| Year: | 2014 |
| Publisher: | Wiley VCH |
| Department(s): | Moderne Magnetische Systeme |
| Bibtex Type: | Article (article) |
| Address: | Weinheim |
| DOI: | 10.1002/adma.201402028 |
| Language: | eng |
|
BibTex @article{escidoc:0186,
title = {{Element specific monolayer depth profiling}},
author = {Macke, S. and Radi, A. and Hamann-Borrero, J. E. and Verna, A. and Bluschke, M. and Br\"uck, S. and Goering, E. and Sutarto, R. and He, F. and Cristiani, G. and Wu, M. and Benckiser, E. and Habermeier, H.-U. and Logvenov, G. and Gauquelin, N. and Botton, G. A. and Kajdos, A. P. and Stemmer, S. and Sawatzky, G. A. and Haverkort, M. W. and Keimer, B. and Hinkov, V.},
journal = {{Advanced Materials}},
volume = {26},
number = {38},
pages = {6554--6559},
publisher = {Wiley VCH},
address = {Weinheim},
year = {2014},
doi = {10.1002/adma.201402028}
}
|
|
