Header logo is

Advances in EELS spectroscopy by using new detector and new specimen preparation technologies

2003

Article

zwe-csfm


Author(s): Scheu, C. and Gao, M. and Van Benthem, K. and Tsukimoto, S. and Schmidt, S. and Sigle, W. and Richter, G. and Thomas, J.
Journal: Journal of Microscopy-Oxford
Volume: 210
Pages: 16-24
Year: 2003

Department(s): CSF Materials
Bibtex Type: Article (article)

DOI: DOI 10.1046/j.1365-2818.2003.01181.x

BibTex

@article{escidoc:4123526,
  title = {Advances in EELS spectroscopy by using new detector and new specimen preparation technologies},
  author = {Scheu, C. and Gao, M. and Van Benthem, K. and Tsukimoto, S. and Schmidt, S. and Sigle, W. and Richter, G. and Thomas, J.},
  journal = {Journal of Microscopy-Oxford},
  volume = {210},
  pages = {16-24},
  year = {2003},
  doi = {DOI 10.1046/j.1365-2818.2003.01181.x}
}