Publications | Max Planck Institute for Intelligent Systems

9 results (View BibTeX file of all listed publications)

Xie, H., Onal, C., Régnier, S., Sitti, M.

In Atomic Force Microscopy Based Nanorobotics, pages: 237-311, Springer Berlin Heidelberg, 2011 (incollection)

pi Xie, H., Onal, C., Régnier, S., Sitti, M. Automated Control of AFM Based Nanomanipulation In Atomic Force Microscopy Based Nanorobotics, pages: 237-311, Springer Berlin Heidelberg, 2011 (incollection)

Xie, H., Onal, C., Régnier, S., Sitti, M.

In Atomic Force Microscopy Based Nanorobotics, pages: 145-235, Springer Berlin Heidelberg, 2011 (incollection)

pi Xie, H., Onal, C., Régnier, S., Sitti, M. Teleoperation Based AFM Manipulation Control In Atomic Force Microscopy Based Nanorobotics, pages: 145-235, Springer Berlin Heidelberg, 2011 (incollection)

Xie, H., Onal, C., Régnier, S., Sitti, M.

In Atomic Force Microscopy Based Nanorobotics, pages: 13-29, Springer Berlin Heidelberg, 2011 (incollection)

pi Xie, H., Onal, C., Régnier, S., Sitti, M. Descriptions and challenges of AFM based nanorobotic systems In Atomic Force Microscopy Based Nanorobotics, pages: 13-29, Springer Berlin Heidelberg, 2011 (incollection)

Xie, H., Onal, C., Régnier, S., Sitti, M.

In Atomic Force Microscopy Based Nanorobotics, pages: 313-342, Springer Berlin Heidelberg, 2011 (incollection)

pi Xie, H., Onal, C., Régnier, S., Sitti, M. Applications of AFM Based Nanorobotic Systems In Atomic Force Microscopy Based Nanorobotics, pages: 313-342, Springer Berlin Heidelberg, 2011 (incollection)

Xie, H., Onal, C., Régnier, S., Sitti, M.

In Atomic Force Microscopy Based Nanorobotics, pages: 87-143, Springer Berlin Heidelberg, 2011 (incollection)

pi Xie, H., Onal, C., Régnier, S., Sitti, M. Nanomechanics of AFM based nanomanipulation In Atomic Force Microscopy Based Nanorobotics, pages: 87-143, Springer Berlin Heidelberg, 2011 (incollection)

Xie, H., Onal, C., Régnier, S., Sitti, M.

Springer, 2011 (misc)

Xie, H., Onal, C., Régnier, S., Sitti, M.

In Atomic Force Microscopy Based Nanorobotics, pages: 31-86, Springer Berlin Heidelberg, 2011 (incollection)

pi Xie, H., Onal, C., Régnier, S., Sitti, M. Instrumentation Issues of an AFM Based Nanorobotic System In Atomic Force Microscopy Based Nanorobotics, pages: 31-86, Springer Berlin Heidelberg, 2011 (incollection)