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2020


SIMULTANEOUS CALIBRATION METHOD FOR MAGNETIC LOCALIZATION AND ACTUATION SYSTEMS
SIMULTANEOUS CALIBRATION METHOD FOR MAGNETIC LOCALIZATION AND ACTUATION SYSTEMS

Sitti, M., Son, D., Dong, X.

2020, US Patent App. 16/696,605 (misc)

Abstract
The invention relates to a method of simultaneously calibrating magnetic actuation and sensing systems for a workspace, wherein the actuation system comprises a plurality of magnetic actuators and the sensing system comprises a plurality of magnetic sensors, wherein all the measured data is fed into a calibration model, wherein the calibration model is based on a sensor measurement model and a magnetic actuation model, and wherein a solution of the model parameters is found via a numerical solver order to calibrate both the actuation and sensing systems at the same time.

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[BibTex]


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TUM Flyers: Vision-Based MAV Navigation for Systematic Inspection of Structures

Usenko, V., Stumberg, L. V., Stückler, J., Cremers, D.

In Bringing Innovative Robotic Technologies from Research Labs to Industrial End-users: The Experience of the European Robotics Challenges, 136, pages: 189-209, Springer International Publishing, 2020 (inbook)

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[BibTex]

[BibTex]

2011


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Automated Control of AFM Based Nanomanipulation

Xie, H., Onal, C., Régnier, S., Sitti, M.

In Atomic Force Microscopy Based Nanorobotics, pages: 237-311, Springer Berlin Heidelberg, 2011 (incollection)

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[BibTex]

2011


[BibTex]


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Teleoperation Based AFM Manipulation Control

Xie, H., Onal, C., Régnier, S., Sitti, M.

In Atomic Force Microscopy Based Nanorobotics, pages: 145-235, Springer Berlin Heidelberg, 2011 (incollection)

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[BibTex]

[BibTex]


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Descriptions and challenges of AFM based nanorobotic systems

Xie, H., Onal, C., Régnier, S., Sitti, M.

In Atomic Force Microscopy Based Nanorobotics, pages: 13-29, Springer Berlin Heidelberg, 2011 (incollection)

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[BibTex]

[BibTex]


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Applications of AFM Based Nanorobotic Systems

Xie, H., Onal, C., Régnier, S., Sitti, M.

In Atomic Force Microscopy Based Nanorobotics, pages: 313-342, Springer Berlin Heidelberg, 2011 (incollection)

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[BibTex]

[BibTex]


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Nanomechanics of AFM based nanomanipulation

Xie, H., Onal, C., Régnier, S., Sitti, M.

In Atomic Force Microscopy Based Nanorobotics, pages: 87-143, Springer Berlin Heidelberg, 2011 (incollection)

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[BibTex]

[BibTex]


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Instrumentation Issues of an AFM Based Nanorobotic System

Xie, H., Onal, C., Régnier, S., Sitti, M.

In Atomic Force Microscopy Based Nanorobotics, pages: 31-86, Springer Berlin Heidelberg, 2011 (incollection)

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[BibTex]

[BibTex]