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High-resolution analysis of currents at low-angle grain boundaries in YBCO thin films using magnetooptics and magnetic x-ray microscopy

2016

Article

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Author(s): Ruoß, S. and Stahl, C. and Bayer, J. and Schütz, G. and Albrecht, J. and Laviano, F.
Journal: {IEEE Transactions on Applied Superconductivity}
Volume: 26
Number (issue): 3
Year: 2016
Publisher: IEEE

Department(s): Modern Magnetic Systems
Bibtex Type: Article (article)

Address: New York, NY
DOI: 10.1109/TASC.2016.2549180
Language: eng

BibTex

@article{escidoc:0067,
  title = {{High-resolution analysis of currents at low-angle grain boundaries in YBCO thin films using magnetooptics and magnetic x-ray microscopy}},
  author = {Ruo\ss, S. and Stahl, C. and Bayer, J. and Sch\"utz, G. and Albrecht, J. and Laviano, F.},
  journal = {{IEEE Transactions on Applied Superconductivity}},
  volume = {26},
  number = {3},
  publisher = {IEEE},
  address = {New York, NY},
  year = {2016},
  doi = {10.1109/TASC.2016.2549180}
}