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Atomic force microscope probe based controlled pushing for nano-tribological characterization

2003

Article

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Author(s): Sitti, Metin
Journal: IEEE/ASME Transactions on Mechatronics
Volume: 8
Number (issue): 3
Year: 2003

Department(s): Physical Intelligence
Bibtex Type: Article (article)

BibTex

@article{sitti2003atomic,
  title = {Atomic force microscope probe based controlled pushing for nano-tribological characterization},
  author = {Sitti, Metin},
  journal = {IEEE/ASME Transactions on Mechatronics},
  volume = {8},
  number = {3},
  year = {2003}
}